Project Close-out Webinar: Reducing “Time to First Good AM Part” Through In-situ Sensor Driven NDE

Project Close-out Webinar: Reducing “Time to First Good AM Part” Through In-situ Sensor Driven NDE  

Currently, metal AM is being utilized as an iterative trial-and-error printing process that requires time consuming post-inspection steps to inform each design/build iteration. This approach currently has long lead times and high costs associated with getting to the “first good AM part.” especially for high criticality applications. The University of Dayton Research Institute (UDRI) has teamed up with Northrop Grumman Corporation (NGC), ZEISS, Open Additive (OA), and Macy Consulting Inc. to demonstrate how in-situ LPBF sensors can inform smarter, “point of concern”, part inspections that significantly reduce the cost and lead time associated with producing and inspecting metal AM parts.

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Date/Time

May 27
11:00 am – 12:00 pm

Please note: Citizens of the following countries will NOT be allowed to participate: China, Cuba, North Korea, Libya, Syria, Iran, and Sudan. Registration from these countries will be cancelled.

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